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​​3C-SiC Substrate N type Product Grade For 5G Communications​​

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​​3C-SiC Substrate N type Product Grade For 5G Communications​​

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Brand Name : ZMSH

Model Number : 3C-N SiC

Certification : rohs

Place of Origin : CHINA

MOQ : 10pc

Price : by case

Payment Terms : T/T

Supply Ability : 1000pc/month

Delivery Time : in 30days

Packaging Details : customzied plastic box

Size : 2inch,4inch,6inch,5×5,10×10

Dielectric Constant : 9.7

Surface Hardness : HV0.3>2500

Density : 3.21 G/cm3

Thermal Expansion Coefficient : 4.5 X 10-6/K

Breakdown Voltage : 5.5 MV/cm

Applications : Communications, Radar systems

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3C-SiC Substrate Product Description

​​3C-SiC Substrate N type Product Grade For 5G Communications​​

ZMSH specializes in the R&D and production of third-generation semiconductor materials, with over a decade of industry expertise. We provide customized services for semiconductor materials such as sapphire, silicon wafers, and SOI. In the field of silicon carbide (SiC), we cover 4H/6H/3C-type substrates, supporting full-size supply from 2-inch to 12-inch wafers, with flexible customization to meet client requirements, achieving integrated industrial and trade services.

Our ​​SiC substrates​​ are engineered for ​​high-frequency power devices​​ and ​​automotive applications​​ (e.g., EV inverters), offering ​​thermal stability up to 1,600°C​​ and ​​thermal conductivity of 49 W/m·K​​, outperforming silicon-based alternatives . We adhere to ​​international standards​​ and hold certifications for ​​aerospace-grade materials​​, ensuring compatibility with extreme environments.


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3C-SiC Substrate ​​Core Features​​

​​3C-SiC Substrate N type Product Grade For 5G Communications​​

1. Multi-size Coverage​​:

  • Standard sizes: 2-inch, 4-inch, 6-inch, 8-inch.
  • Customizable dimensions: From 5×5 mm to tailored specifications.

2. ​​Low Defect Density​​:

  • Microvoid density <0.1 cm⁻², resistivity ≤0.0006 Ω·cm, ensuring high device reliability.

​​3. Process Compatibility​​:

  • 3C-SiC substrate is suitable for high-temperature oxidation, lithography, and other complex processes.
  • Surface flatness: λ/10 @632.8 nm, ideal for precision device manufacturing.


3C-SiC Substrate ​​Material Properties​​

1. Electrical Advantages​​:

  • ​​High Electron Mobility​​: 3C-SiC achieves 1,100 cm²/V·s, significantly outperforming 4H-SiC (900 cm²/V·s), reducing conduction losses.
  • ​​Wide Bandgap​​: 3.2 eV bandgap enables high-voltage tolerance (up to 10 kV).

2. ​​Thermal Performance​​:

  • ​​High Thermal Conductivity​​: 49 W/m·K, superior to silicon, supporting stable operation from -200°C to 1,600°C.

​​3. Chemical Stability​​:

  • Resistant to acids/alkalis and radiation, suitable for aerospace and nuclear applications.


3C-SiC Substrate ​​Material Technical Parameter

​​Grade​​ Zero MPD Production Grade (Z Grade) Standard Production Grade (P Grade) Dummy Grade (D Grade)
Diameter 145.5 mm–150.0 mm
Thickness 350 μm ±25 μm
Wafer Orientation Off axis: 2.0°-4.0°toward [1120]± 0.5° for 4H/6H-P, On axis: 〈111〉 ± 0.5° for 3C-N
** Micropipe Density 0 cm⁻²
** Resistivity

p-type 4H/6H-P

≤0.1 Ω·cm ≤0.3 Ω·cm
n-type 3C-N ≤0.8 mΩ·cm ≤1 mΩ·cm
Primary Flat Orientation 4H/6H-P {1010} ±5.0°
3C-N {110} ±5.0°
Primary Flat Length 32.5 mm ±2.0 mm
Secondary Flat Length 18.0 mm ±2.0 mm
Secondary Flat Orientation Silicon face up, 90° CW. from Prime flat ±5.0°
Edge Exclusion 3 mm 6 mm
LTV/TIV/Bow/Warp ≤2.5 μm/≤5 μm/≤15 μm/≤30 μm ≤10 μm/≤15 μm/≤25 μm/≤40 μm
* Roughness Polish Ra≤1 nm
CMP Ra≤0.2 nm Ra≤0.5 nm
Edge Cracks By High Intensity Light None Cumulative length≤10 mm, single length≤2 mm
* Hex Plates By High Intensity Light Cumulative area≤0.05% Cumulative area≤0.1%
* Polytype Areas By High Intensity Light None Cumulative area≤3%
Visual Carbon Inclusions None Cumulative area≤0.05%
# Silicon Surface Scratches By High Intensity Light None Cumulative length≤1×wafer diameter
Edge Chips High By Intensity Light None permitted≥0.2mm width and depth 5 allowed, ≤1 mm each
Silicon Surface Contamination By High Intensity None
Packaging Multi-wafer Cassette or Single Wafer Container

Notes:

* Defects limits apply to entire wafer surface except for the edge exclusion area.

* The scratches should be checked on Si face only.


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Application Scenarios for 3C-SiC Substrates​​

​​3C-SiC Substrate N type Product Grade For 5G Communications​​

1. High-Frequency Power Devices​​:

  • ​​5G Communication Base Stations​​: 3C-SiC substrates​ serves as RF device substrates, enabling mmWave signal transmission for high-speed communication.
  • ​​Radar Systems​​: Low-loss characteristics minimize signal attenuation, enhancing detection accuracy.

​​2. Electric Vehicles (EVs)​​:

  • ​​On-Board Chargers (OBC)​​: 3C-SiC substrates reduces energy loss by 40%, shortening charging time for 800V platforms.
  • ​​DC/DC Converters​​: 3C-SiC substrates cuts 80–90% energy loss, improving driving range.

​​3. Industrial & Energy​​:

  • ​​Solar Inverters​​: Boosts efficiency by 1–3%, reduces volume by 40–60%, and withstands harsh environments.
  • ​​Smart Grids​​: Reduces equipment size/weight and cooling demands, lowering infrastructure costs.

4. ​​Aerospace​​:

  • ​​Radiation-Hardened Devices​​: 3C-SiC substrates replaces silicon-based components in satellites and rockets, enhancing radiation resistance and lifespan.


Recommend other models of SiC

Q1: What is 3C-SiC substrate?​​

​​A1:​​ 3C-SiC (cubic silicon carbide) is a semiconductor material with a cubic crystal structure, offering high electron mobility (1,100 cm²/V·s) and thermal conductivity (49 W/m·K), ideal for high-frequency and high-temperature applications.

​​Q2: What are the main applications of 3C-SiC substrates?​​

​​A2:​​ 3C-SiC substrates are used in ​​5G RF devices​​, ​​EV inverters​​, and ​​aerospace electronics​​ due to their low-loss characteristics and radiation resistance.

Tag: #Silicon carbide substrate, #3C-N type SIC, #Semiconductor materials, #3C-SiC Substrate, #Product Grade, #5G Communications​​


Product Tags:

N-type SiC substrate for 5G

      

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